STANFORD RESEARCH SYSTEMS SR720 CALIBRATION and STANFORD RESEARCH SYSTEMS SR720 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the STANFORD RESEARCH SYSTEMS SR720 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   STANFORD RESEARCH SYSTEMS SR720   Description / Specification:    
STANFORD RESEARCH SYSTEMS SR720 100 kHz LCR Meter

The SRS SR720 LCR Meter measures passive components with as little as 0.05 % error. These easy-to-use instruments are quick to setup, adjust and calibrate. The SRS SR720 is ideal for applications such as incoming inspection, quality control, automated test, and general benchtop use. A 5-digit LED display shows measured values, entered parameters, instrument status, and user messages. When making measurements, the major parameter (L, C or R) is shown on the left display and the appropriate minor parameter (Q, D or R) is shown on the right display. Measurements can be performed at test frequencies of 100 Hz, 120 Hz, 1 kHz, 10 kHz and 100 kHz. A built-in drive voltage can be set to preset values (0.1, 0.25 and 1.0 V) or adjusted from 0.1 to 1.0 V in 50 mV increments. Measurements are taken at rates of 2, 10 or 20 samples per second. Consecutive readings can be averaged between two and ten times for increased accuracy. Both series or parallel equivalent circuit models of a component are supported. Capacitor measurements use either the internal 2.0 VDC bias or an external source of up to 40 VDC.



 

Standard Calibration $265.00 *
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*This is a Web introductory price for one calibration of the STANFORD RESEARCH SYSTEMS SR720. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Channel Bandwidth
Channel Bandwidth is the bandwidth over which power is measured. This is usually the bandwidth in which almost all of the power of a signal is contained.

Jitter
Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. Jitter is the time variation of a periodic signal in electronics and telecommunications, often in relation to a reference clock source. Jitter may be observed in characteristics such as the frequency of successive pulses, the signal amplitude, or phase of periodic signals. Jitter is a significant, and usually undesired, factor in the design of almost all communications links (e.g., USB, PCI-e, SATA, OC-48). In clock recovery applications it is called timing jitter.

Overshoot
Overshoot is the distortion that follows a major transition; the difference between the peak power point and the pulse-top amplitude computed as a percentage of the pulse-top amplitude.

Rise Time
Rise time refers to the time required for a signal to change from a specified low value to a specified high value, usually 10 and 90 percent of pulse-top amplitude (vertical display is linear power).

Please contact us for your STANFORD RESEARCH SYSTEMS SR720 CALIBRATION and/or STANFORD RESEARCH SYSTEMS SR720 100 kHz LCR Meter REPAIR
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