STANFORD RESEARCH SYSTEMS SR720 CALIBRATION and STANFORD RESEARCH SYSTEMS SR720 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the STANFORD RESEARCH SYSTEMS SR720 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   STANFORD RESEARCH SYSTEMS SR720   Description / Specification:    
STANFORD RESEARCH SYSTEMS SR720 100 kHz LCR Meter

The SRS SR720 LCR Meter measures passive components with as little as 0.05 % error. These easy-to-use instruments are quick to setup, adjust and calibrate. The SRS SR720 is ideal for applications such as incoming inspection, quality control, automated test, and general benchtop use. A 5-digit LED display shows measured values, entered parameters, instrument status, and user messages. When making measurements, the major parameter (L, C or R) is shown on the left display and the appropriate minor parameter (Q, D or R) is shown on the right display. Measurements can be performed at test frequencies of 100 Hz, 120 Hz, 1 kHz, 10 kHz and 100 kHz. A built-in drive voltage can be set to preset values (0.1, 0.25 and 1.0 V) or adjusted from 0.1 to 1.0 V in 50 mV increments. Measurements are taken at rates of 2, 10 or 20 samples per second. Consecutive readings can be averaged between two and ten times for increased accuracy. Both series or parallel equivalent circuit models of a component are supported. Capacitor measurements use either the internal 2.0 VDC bias or an external source of up to 40 VDC.



 

Standard Calibration $285.00 *
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*This is a Web introductory price for one calibration of the STANFORD RESEARCH SYSTEMS SR720. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity
Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity
Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.

Please contact us for your STANFORD RESEARCH SYSTEMS SR720 CALIBRATION and/or STANFORD RESEARCH SYSTEMS SR720 100 kHz LCR Meter REPAIR
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