STANFORD RESEARCH SYSTEMS SR770 CALIBRATION and STANFORD RESEARCH SYSTEMS SR770 REPAIR

 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the STANFORD RESEARCH SYSTEMS SR770 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   STANFORD RESEARCH SYSTEMS SR770   Description / Specification:    
STANFORD RESEARCH SYSTEMS SR770 100 kHz FFT Spectrum Analyzer w/source

The SRS SR770 is a single-channel 100 kHz FFT spectrum analyzer w/source with a dynamic range of 90 dB and a real-time bandwidth of 100 kHz. The speed and dynamic range of these instruments, coupled with their flexibility and many analysis modes, makes them the ideal choice for a variety of applications including acoustics, vibration, noise measurement and general electronic use. The SRS SR770 has a dynamic range of 90 dB. This means that for a full-scale input signal, the instruments have no spurious responses larger than -90 dBc (1 part in 30,000). Even signals as small as -114 dBc (1 part in 500,000) may be observed by using averaging. The low front-end noise and low harmonic distortion of the SRS SR770 allows you to see signals that would be buried in the noise of other analyzers. The SR770 includes a low-distortion (-80 dB), synthesized source which can be used to make frequency response measurements. It generates single frequency sine waves, two-tone signals for intermodulation distortion (IMD) testing, pink and white noise for audio and electronic applications, and frequency chirp for transfer function analysis. This direct digital synthesis (DDS) source provides an output level from 100 µV to 1 V, and delivers up to 50 mA of current. Specifications. Frequency Measurement range: 476 µHz to 100 kHz. Frequency Spans: 191 mHz to 100 kHz in a binary sequence. Center frequency: Anywhere within the 0 to 100 kHz measurement range. Frequency Accuracy: 25 ppm from 20 °C to 40 °C. Frequency Resolution: Span/400. Number of channels: 1. Input: Single-ended or differential. Input impedance: 1 M-ohm, 15 pF. Amplitude Full-scale input range: -60 dBV (1.0 mVp) to +34 dBV (50 Vp) in 2 dB steps. Dynamic range: 90 dB (typ.). Trigger Input Modes: Continuous, internal, external, TTL. Internal level: Adjustable to ±100 % of input scale. Positive or negative slope. Source Amplitude range: 0.1 mVp to 1.0 Vp. Amplitude resolution: 1 mVp (output >100 mVp), 0.1 mVp (output <100 mVp). DC offset: <10.0 mV (typ.).



 

Standard Calibration $475.00 *
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*This is a Web introductory price for one calibration of the STANFORD RESEARCH SYSTEMS SR770. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related RF Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Channel Bandwidth
Channel Bandwidth is the bandwidth over which power is measured. This is usually the bandwidth in which almost all of the power of a signal is contained.

Mismatch Uncertainty
Mismatch Uncertainty is caused by re-reflections between one device (the source) and the device that follows it (the load).

Rise Time
Rise time refers to the time required for a signal to change from a specified low value to a specified high value, usually 10 and 90 percent of pulse-top amplitude (vertical display is linear power).


Please contact us for your STANFORD RESEARCH SYSTEMS SR770 CALIBRATION and/or STANFORD RESEARCH SYSTEMS SR770 100 kHz FFT Spectrum Analyzer w/source REPAIR

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