EXFO IQS-5240S-NS1623 CALIBRATION and EXFO IQS-5240S-NS1623 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the EXFO IQS-5240S-NS1623 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   EXFO IQS-5240S-NS1623   Description / Specification:    
EXFO IQS-5240S-NS1623 950 to 1650 nm Optical Spectrum Analyzer (OSA) Module

The Exfo IQS-5240S-NS1623 Optical Spectrum Analyzer (OSA) has 33 pm (or ~4.5 GHz) resolution bandwidth defined as the FWHM of the OSA filter shape, the instrument can analyze all densely spaced signals, including important 50 GHz ITU-grid WDM signals, high-speed modulated lasers/emitters and DWDM passive components, all critical in today’s networks. Combined with a very sharp rejection ratio (–35 dBc at 0.1 nm), the optical signal-to-noise ratio (OSNR) and modulated band profile can be measured with high accuracy. To ensure accurate noise and broad signal power measurements, the noise equivalent bandwidth (NEB) of the OSA is calibrated at many points from 950 nm to 1650 nm. Specifications. Wavelength range: 1250 to 1650 nm. Wavelength uncertainty (1520 to 1610 nm): ±0.05 nm. Resolution bandwidth (FWHM): 0.065 nm. Wavelength linearity: ±0.01 nm. Dynamic range (per channel): –80 to +18 dBm. Maximum total safe power: +23 dBm. Absolute power uncertainty: ±0.5 dB. Optical rejection ratio at 1550 nm at 0.2 nm (25 GHz): 35 dB (40 typical). Channel spacing: 50 to 200 GHz CWDM. PDL at 1550 nm: ±0.08 dB. Options. 00 = Without polarization controller, P = With polarization controller. 28 = UPC/DIN 47256, 76 = UPC/HMS-10/AG, 89 = UPC/FC narrow key, 90 = UPC/ST, 91 = UPC/SC, 95 = UPC/E-2000, 28 = APC/DIN 47256, 89 = APC/FC narrow key, 91 = APC/SC, 95 = APC/E-2000. 00 = Without software option, InB = With In-Band OSNR software.



 

Standard Calibration $540.00 *
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*This is a Web introductory price for one calibration of the EXFO IQS-5240S-NS1623. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Optical Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Amplified Spontaneous Emission Source (ASE)
ASE, a process where spontaneously emitted radiation (luminescence) is amplified. In lasers and particularly in high-gain erbium-doped amplifiers, amplified spontaneous emission is usually an unwanted effect. It tends to limit the gain achievable in a single stage of a fiber optic amplifier to the order of 40–50 dB.

Dynamic Range
In a transmission system, the ratio of the overload level to the noise level of the system, usually expressed in dB. Ratio of the highest to lowest detectable signal of a system, expressed in dB.

Optical Power
Optical Power is usually measured in "dBm", or decibels referenced to one miliwatt of power. while loss is a relative reading, optical power is an absolute measurement, referenced to standards. You measure absolute power to test transmitters or receivers and relative power to test loss.

Relative Wavelength Accuracy
When randomly changing the wavelength and measuring the differences between the actual and displayed wavelengths, the relative wavelength accuracy is ± half the span between the maximum and the minimum value of all differences.

Wavelength
Wavelength is a term for the color of light, usually expressed in nanometers (nm) or microns (m). In Fiber Optics the wavelenghts mostly used are in the infrared region where the light is invisible to the human eye.

Please contact us for your EXFO IQS-5240S-NS1623 CALIBRATION and/or EXFO IQS-5240S-NS1623 950 to 1650 nm Optical Spectrum Analyzer (OSA) Module REPAIR
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