ASSOCIATED RESEARCH 8105 CALIBRATION and ASSOCIATED RESEARCH 8105 REPAIR
 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the ASSOCIATED RESEARCH 8105 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   ASSOCIATED RESEARCH 8105 (OMNIA 5)   Description / Specification:    
ASSOCIATED RESEARCH 8105 5KV AC/DC Hipot / IR / Ground Bond / Continuity Tester

The Associated Research 8105 OMNIA 5 is a 5 kVAC/DC Hipot tester with a built-in Insulation Resistance, Ground Bond, Run Test and Continuity Tester. The AR 8105 uses four-wire measurement technique to factor out test lead resistance, making measurements more accurate. The Milliohm Offset features allows the operator to factor out additional lead and fixture resistance. It has patented SmartGFI™ which disables the instrument’s output voltage in less than 1 millisecond if excessive leakage to ground is detected. If enabled, SmartGFI™ automatically detects if the DUT is floating or grounding and turns ON or OFF accordingly. The OMNIA simultaneously monitors real and total current in AC Hipot mode on the same screen.Specifications. Dielectric Withstand Test Mode Output Rating: 5000 V @ 40 mA AC, 5000 V @ 20 mA DC. Output Adjustment Range: 0 - 5.00 KV AC, 0 - 5.00 KV DC. Voltage Setting Resolution: 1 V. Voltage Setting Accuracy: ± (2% of setting + 5 V). HI and LO-Limit AC Total Range: 0.000 - 9.999 mA, Resolution 0.001 mA. HI and LO-Limit DC Range: 0.0 - 999.9 µA, Resolution 0.1 µA. Arc Detection Range: 1 – 9. Ground Continuity Current: DC 0.1 A ± 0.01 A (Max. ground Resistance 1 ohm ± 0.1 ohm, fixed). AC Output Waveform: Sine Wave, Crest Factor = 1.3 - 1.5. Output Frequency Range: 50 or 60 Hz, User Selectable. Insulation Resistance Test Mode Voltage Setting Range: 50 - 1000 VDC, Resolution 1 Volt, Accuracy ± (2% of setting + 2 counts). Resistance Display Range: 0.05 M-ohm – 50,000 M-ohm (4 Digit, Auto Ranging). Ground Bond Test Mode Output Voltage Range: 3.00 – 8.00 VAC, Resolution 0.01 V, Accuracy ± (2 % of setting + 0.03V) O.C. Condition. Run Test Mode DUT Power Voltage: 0 – 277 VAC Single Phase Unbalanced (One Hot or Line conductor and One Neutral). Current: 15AAC max continuous. Memory: 50 memories, 30 step/memory. Interface: Standard USB/RS-232, GPIB or Ethernet. Graphic Display: 320 X 240 Monographic LCD. Options. Scanning Matrix, 4 or 8 port high voltage switching matrix with continuity.



 

Standard Calibration $470.00 *
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*This is a Web introductory price for one calibration of the ASSOCIATED RESEARCH 8105. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Channel Bandwidth
Channel Bandwidth is the bandwidth over which power is measured. This is usually the bandwidth in which almost all of the power of a signal is contained.

Jitter
Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. Jitter is the time variation of a periodic signal in electronics and telecommunications, often in relation to a reference clock source. Jitter may be observed in characteristics such as the frequency of successive pulses, the signal amplitude, or phase of periodic signals. Jitter is a significant, and usually undesired, factor in the design of almost all communications links (e.g., USB, PCI-e, SATA, OC-48). In clock recovery applications it is called timing jitter.

Overshoot
Overshoot is the distortion that follows a major transition; the difference between the peak power point and the pulse-top amplitude computed as a percentage of the pulse-top amplitude.

Rise Time
Rise time refers to the time required for a signal to change from a specified low value to a specified high value, usually 10 and 90 percent of pulse-top amplitude (vertical display is linear power).

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