|
|
The Keysight N5247B 10 MHz to 67 GHz PNA-X microwave network analyzer offers a versatile and fully integrated microwave test platform. Specializing in characterizing active devices like amplifiers, mixers, and frequency converters, the PNA-X hardware includes dual internal signal sources, a signal combiner, S-parameter and noise receivers, pulse modulators and generators, and a set of switches and RF access points. The hardware integrations offer a wide range of both linear and nonlinear measurements, all accessible through a single set of connections to your device under test (DUT). Specifications.
Maximum System Dynamic Range, Opt 201/401: 131 dB (3.2 GHz to 26.5 GHz, Port 1, 3), 132 dB (1 GHz to 2 GHz, Port 2, 4). Maximum System Dynamic Range, Opt 219/419: 130 dB (3.2 GHz to 10 GHz, Port 1, 3), 132 dB (1 GHz to 2 GHz, Port 2, 4). Maximum Receiver Dynamic Range: 134 dB (1 GHz to 10 GHz). Test Ports: 1.85 mm (male), 50 ohm (nominal), (nominal), 0.002 in. (characteristic).
Test Port Output. Frequency Range: 10 MHz to 67 GHz, 900 Hz to 67 GHz (Option 425). Frequency Resolution: 1 Hz. Frequency Accuracy: ±0.7 ppm. Initial Frequency Accuracy: ±0.2 ppm. Frequency Stability Typical: ±0.05 ppm, -10° to 70° C. Maximum Leveled Power, Opt 201/401: 13 dBm (3.2 GHz to 10 GHz, Port 1, 3), 13 dBm (50 MHz to 10 GHz, Port 2, 4).
Test Port Input. Maximum Test Port Noise Floor: -118 dBm (16 GHz to 26.5 GHz).
Hardware options. N5247B-201 2-port, configurable test set. N5247B-219 2-port, configurable test set, source attenuators, receiver attenuators, bias tees. N5247B-224 2-port, configurable test set, source attenuators, receiver attenuators, bias tees, second source, combiner, mechanical switches. N5247B-401 4-port, configurable test set, second source. N5247B-419 4-port, configurable test set, second source, source attenuators, receiver attenuators, bias tees. N5247B-423 4-port, configurable test set, second source, source attenuators, receiver attenuators, bias tees, combiner, mechanical switches. N5247B-425 4-port, configurable test set, second source, attenuators, combiner, mechanical switches, bias tees, low frequency extension.
|