ASSOCIATED RESEARCH 7620 CALIBRATION and ASSOCIATED RESEARCH 7620 REPAIR

 
A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the ASSOCIATED RESEARCH 7620 Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

 

 
   ASSOCIATED RESEARCH 7620   Description / Specification:    
ASSOCIATED RESEARCH 7620 5 kVAC HypotULTRA III Hipot tester / Continuity tester

The Associated Research 7620 HypotULTRA III is a 5 kVAC Hipot tester with continuity tester. It can perform a low current continuity test simultaneously with the Hipot test, or use the separate continuity test mode to perform an independent continuity test. In this mode, the range is adjustable from 0.01 to 10 ohms. In addition, point-to-point continuity test can be run through the optional built-in scanner. The AR 7620 has up to 30mA of current is available in AC Hipot mode with resolutions of 1 microamps in AC. It has an enhanced graphic LCD display with analog bar graph for monitoring test results. Specifications. Dielectric Withstand Test Mode Output Rating: 5000 V @ 30 mA AC. Output Adjustment Range: 0 - 5.00 KV AC. Voltage Setting Resolution: 1 V. Voltage Setting Accuracy: ± (2% of setting + 5 V) (Adjustable during operation. Disabled when key lockout is active). Maximum Limit AC Range: 0.00 - 9.999 mA, Resolution 0.001 mA. Arc Detection Range: 1 – 9. AC Voltage Waveform: Sine Wave, Crest Factor = 1.3 - 1.5. Output Frequency Range: 50 or 60 Hz, User Selectable. Ground Continuity Current: DC 0.1 A ± 0.01 A (Total Resistance 0.00 ohm - 33.0 ohm), DC 0.01 A ± 0.001 A (Total Resistance 31.0 ohm - 330 ohm), DC 0.001 A ± 0.0001 A (Total Resistance 310 ohm - 2000 ohm). Options. Scanning Matrix, 4 or 8 port high voltage switching matrix with continuity.



 

Standard Calibration $470.00 *
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*This is a Web introductory price for one calibration of the ASSOCIATED RESEARCH 7620. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.


Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Channel Bandwidth
Channel Bandwidth is the bandwidth over which power is measured. This is usually the bandwidth in which almost all of the power of a signal is contained.

Jitter
Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. Jitter is the time variation of a periodic signal in electronics and telecommunications, often in relation to a reference clock source. Jitter may be observed in characteristics such as the frequency of successive pulses, the signal amplitude, or phase of periodic signals. Jitter is a significant, and usually undesired, factor in the design of almost all communications links (e.g., USB, PCI-e, SATA, OC-48). In clock recovery applications it is called timing jitter.

Overshoot
Overshoot is the distortion that follows a major transition; the difference between the peak power point and the pulse-top amplitude computed as a percentage of the pulse-top amplitude.

Rise Time
Rise time refers to the time required for a signal to change from a specified low value to a specified high value, usually 10 and 90 percent of pulse-top amplitude (vertical display is linear power).


Please contact us for your ASSOCIATED RESEARCH 7620 CALIBRATION and/or ASSOCIATED RESEARCH 7620 5 kVAC HypotULTRA III Hipot tester / Continuity tester REPAIR

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