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The Anritsu MS9740A supports the performance and functions for evaluating all active optical devices, including SFP, XFP, and SFP+ modules, as well as optical transceivers and DFB optical sources. It has seven application modes (DFB-LD, FP-LD, LED, PMD, Opt. Amp, WDM, LD Module) matching the measurement target. For example, at evaluation of LD characteristics, analysis items and methods can be tailored to the spectrum, such as a single DFB-LD spectrum, multiple discrete-wavelength FP-LD, wideband LED, etc. Specifications. Wavelength measurement range: 600 nm to 1750 nm. Wavelength accuracy: ±20 pm (1520 nm to 1620 nm, Resolution: 0.03 nm to 0.2 nm), ±100 pm (1520 nm to 1620 nm, Resolution: 0.5 nm, 1.0 nm). Wavelength stability: <= ±5 pm. Wavelength linearity: ±20 pm (1520 nm to 1620 nm). Setting resolution: 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, 1.0 nm; (RBW: 3 dB optical filter: transmission bandwidth). Level accuracy: ±0.4 dB (Wavelength: 1310 nm/1550 nm, Input: –10 dBm, Resolution: >=0.1 nm). Level stability: ±0.02 dB (1 min, Resolution: >= 0.1 nm, Input: -23 dBm, 1550 nm, no polarization fluctuation). High dynamic range: 70 dB (1 nm from peak wavelength), 60 dB (0.4 nm from peak wavelength), 42 dB (0.2 nm from peak wavelength). Normal dynamic range: 62 dB (1 nm from peak wavelength), 58 dB (0.4 nm from peak wavelength), 42 dB (0.2 nm from peak wavelength). Optical return loss: >= 35 dB (1300 nm/1550 nm). Sampling point: 51, 101, 251, 501, 1001, 2001, 5001, 10001, 20001, 50001. Supported optical fiber: 10 µm/125 µm SM fiber (ITU-T G.652), 50 µm/125 µm GI fiber. Optical connector: User replaceable; FC, SC, ST, DIN, LC. Display: 800 × 600 dots, 8.4 inch SVGA color LCD
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The Deviser E8600 is a high-precision diffraction-grating, high-resolution optical spectrometer with wavelength range of 600 nm to 1700 nm. The 10.1” LCD touchscreen and concise graphical user interface of AE8600 offer the easiest way to handle optical spectrum analysis. It provides a wide selection of test methodology, including laser spectrum scans (DPB, FP), WDM system testing, EDFA system testing, transmittance and drift testing, which are essential for in-field and factory applications. The AE8600 offers exceptional stability and reliability, high-speed spectral sweeping, and multiple ways to export and analyze measurement data. It’s the ideal instrument for fast and precise optical spectral testing to satisfy long-term investment with the best cost performance value.
Specifications.
Optical Spectrum Measurement.
Wavelength range: 600 to 1700nm.
Wavelength resolution bandwidth: 0.02 to 2nm.
Wavelength resolution setting: 0.02nm, 0.06nm, 0.1nm, 0.2nm, 0.5nm, 1nm, 2nm.
Wavelength accuracy;
1520 to 1620 nm ±0.02 nm,
1450 to 1520 nm ±0.04 nm,
Entire wavelength range ±0.1 nm.
Wavelength repeatability: ±0.005 nm (1 minute).
Wavelength linearity;
±0.01 nm (1520 to 1580 nm),
±0.02 nm (1450 to 1520 nm, 1580 to 1620 nm).
Minimum sampling resolution: 0.001nm.
Applicable fiber: SM(9.5/125μm), MMF(50/125μm, 62.5/125μm).
Optical Power Measurement.
Level sensitivity;
-90dBm (1300-1620nm, resolution ≥0.05nm),
-85dbm (1000-1300nm, resolution ≥0.05nm),
-60dBm (600 - 1000nm, resolution ≥0.05nm).
Maximum input power: +20dBm.
Level accuracy: ±0.4dB (1310/1550nm, input level -20dBm).
Level linearity: ±0.05dB( input level: -50 to +10dBm).
Wavelength sampling points (Maximum): 50,000.
Optical return loss: >35dB (with angled-PC connector).
Polarization dependence: ±0.05dB (1550nm).
Dynamic range;
Peak ±0.1nm 39dB (Resolution: 0.02nm),
Peak ±0.4nm 60dB (Resolution: 0.05nm).
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