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600 nm to 1700 nm, Standard performance benchtop Optical Spectrum Analyzer, 9/125 um optical input. Wavelength Reproducibility (1 min): ±0.003 nm. Wavelength Span Range: 0.2 nm to full range and zero span. Wavelength Absolute Accuracy: ±0.5 nm. Wavelength Span Linearity: 1525 nm - 1570 nm, ±0.02 nm. Wavelength Span Linearity: ±0.05 nm, for spans <40nm. Maximum Sensitivity (1250-1610 nm): –90 dBm. Maximum Sweep Rate: 40 nm/50 ms. Max Measurement Power: +15 dBm per channel (+12 dBm per channel, 1000–1525 nm), +30 dBm total. Dynamic Range In 0.1 nm resolution 1250–1610 nm (chop mode on) ±0.5 nm, ±1 nm, ±5 nm: 70 dB. Resolution Bandwidth: 0.07 nm, 0.1 nm, 0.2 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm
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The Deviser E8600 is a high-precision diffraction-grating, high-resolution optical spectrometer with wavelength range of 600 nm to 1700 nm. The 10.1” LCD touchscreen and concise graphical user interface of AE8600 offer the easiest way to handle optical spectrum analysis. It provides a wide selection of test methodology, including laser spectrum scans (DPB, FP), WDM system testing, EDFA system testing, transmittance and drift testing, which are essential for in-field and factory applications. The AE8600 offers exceptional stability and reliability, high-speed spectral sweeping, and multiple ways to export and analyze measurement data. It’s the ideal instrument for fast and precise optical spectral testing to satisfy long-term investment with the best cost performance value.
Specifications.
Optical Spectrum Measurement.
Wavelength range: 600 to 1700nm.
Wavelength resolution bandwidth: 0.02 to 2nm.
Wavelength resolution setting: 0.02nm, 0.06nm, 0.1nm, 0.2nm, 0.5nm, 1nm, 2nm.
Wavelength accuracy;
1520 to 1620 nm ±0.02 nm,
1450 to 1520 nm ±0.04 nm,
Entire wavelength range ±0.1 nm.
Wavelength repeatability: ±0.005 nm (1 minute).
Wavelength linearity;
±0.01 nm (1520 to 1580 nm),
±0.02 nm (1450 to 1520 nm, 1580 to 1620 nm).
Minimum sampling resolution: 0.001nm.
Applicable fiber: SM(9.5/125μm), MMF(50/125μm, 62.5/125μm).
Optical Power Measurement.
Level sensitivity;
-90dBm (1300-1620nm, resolution ≥0.05nm),
-85dbm (1000-1300nm, resolution ≥0.05nm),
-60dBm (600 - 1000nm, resolution ≥0.05nm).
Maximum input power: +20dBm.
Level accuracy: ±0.4dB (1310/1550nm, input level -20dBm).
Level linearity: ±0.05dB( input level: -50 to +10dBm).
Wavelength sampling points (Maximum): 50,000.
Optical return loss: >35dB (with angled-PC connector).
Polarization dependence: ±0.05dB (1550nm).
Dynamic range;
Peak ±0.1nm 39dB (Resolution: 0.02nm),
Peak ±0.4nm 60dB (Resolution: 0.05nm).
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