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The Anritsu MS9001B1 Optical Spectrum Analyzer covers wavelengths up to 1.75 µm and can be used to measure 1.55 µm band light-emitting elements developed for long distance optical communications as well as the loss characteristics of optical parts and materials using white-light sources (MG922A). The 50 dB dynamic range of the MS9001B1 has been achieved by using a spectroscope that has less stray light. This permits accurate measurement of DFB laser side-modes. Specifications. Wavelength range: 0.6 to 1.75 µm. Level measuring range: -70 to +10 dBm (0.7 to 1.6 µm), - 65 to + 10 dBm (0.6 to 1.7 µm), -55 to +10 dBm (1 .6 to 1.75 µm). Measuring level accuracy: ±2 dB (at 0 .85/1.3/1.55 µm). Linearity: ± 0.5 dB/10 dB, ± 1 dB/20 dB, ± 3 dB/60 dB. Polarization: ±0.5 dB (at 1.3/1.55 µm). Level scale: 0.2 to 10 dB/div and LINEAR. Dynamic range (background light level): >=40 dB (level difference between peak level and ± 1 nm from peak level), >=50 dB (level difference between peak level and ± 10 nm from peak level). Wavelength read-out resolution: 2 pm. Wavelength accuracy: ±1 nm, ±0.5 nm (25°C). Resolution bandwidth: 0.1 to 5 nm. Wavelength sweep width: 0 to 100 nm/div. Processing functions: Automatic setting for optimum measurement, subtraction, averaging, peak-search, peak-to-center, spectrum half-width, wavelength calibration, title display, time display, memory backup, direct plotting.
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The Deviser E8600 is a high-precision diffraction-grating, high-resolution optical spectrometer with wavelength range of 600 nm to 1700 nm. The 10.1” LCD touchscreen and concise graphical user interface of AE8600 offer the easiest way to handle optical spectrum analysis. It provides a wide selection of test methodology, including laser spectrum scans (DPB, FP), WDM system testing, EDFA system testing, transmittance and drift testing, which are essential for in-field and factory applications. The AE8600 offers exceptional stability and reliability, high-speed spectral sweeping, and multiple ways to export and analyze measurement data. It’s the ideal instrument for fast and precise optical spectral testing to satisfy long-term investment with the best cost performance value.
Specifications.
Optical Spectrum Measurement.
Wavelength range: 600 to 1700nm.
Wavelength resolution bandwidth: 0.02 to 2nm.
Wavelength resolution setting: 0.02nm, 0.06nm, 0.1nm, 0.2nm, 0.5nm, 1nm, 2nm.
Wavelength accuracy;
1520 to 1620 nm ±0.02 nm,
1450 to 1520 nm ±0.04 nm,
Entire wavelength range ±0.1 nm.
Wavelength repeatability: ±0.005 nm (1 minute).
Wavelength linearity;
±0.01 nm (1520 to 1580 nm),
±0.02 nm (1450 to 1520 nm, 1580 to 1620 nm).
Minimum sampling resolution: 0.001nm.
Applicable fiber: SM(9.5/125μm), MMF(50/125μm, 62.5/125μm).
Optical Power Measurement.
Level sensitivity;
-90dBm (1300-1620nm, resolution ≥0.05nm),
-85dbm (1000-1300nm, resolution ≥0.05nm),
-60dBm (600 - 1000nm, resolution ≥0.05nm).
Maximum input power: +20dBm.
Level accuracy: ±0.4dB (1310/1550nm, input level -20dBm).
Level linearity: ±0.05dB( input level: -50 to +10dBm).
Wavelength sampling points (Maximum): 50,000.
Optical return loss: >35dB (with angled-PC connector).
Polarization dependence: ±0.05dB (1550nm).
Dynamic range;
Peak ±0.1nm 39dB (Resolution: 0.02nm),
Peak ±0.4nm 60dB (Resolution: 0.05nm).
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