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The Keysight 81606A Tunable Laser Source, High Power with Low SSE is the top line module for the 8164B lightwave measurement system. It has been designed to reach a new accuracy level and to increase test efficiency by enabling faster swept-wavelength tests and lower cost of ownership. It accelerates the automated adjustment of wavelength-selective devices with sub-picometer repeatability and best-in-class accuracy, even in the new two-way sweep mode at up to 200 nm/s speed.
The excellent low-SSE performance of better than 80 dB/nm signal-to-source spontaneous emission ratio (signal-to-SSE ratio) and the high signal power permit measurements of wavelength isolation to 100 dB, most often limited by power meter sensitivity.
Specifications.
Wavelength range: 1450 nm to 1650 nm (Option 216), 1490 nm to 1640 nm (Option 116).
Wavelength resolution: 0.1 pm, 12.5 MHz at 1550 nm.
Continuous sweep range: Full wavelength range.
Maximum sweep speed: 200 nm/s, bidirectional.
Wavelength stability (typical): ≤ ± 0.5 pm, 24 hours.
Linewidth (typical): < 10 kHz.
Maximum output power (continuous power during sweep): > +12 dBm peak, > +11 dBm (1515 nm to 1620 nm), > +9 dBm (1480 nm to 1630 nm, Option 216), > +8 dBm (1490 nm to 1640 nm, Option 116), > +5 dBm (1450 nm to 1650 nm, Option 216).
Signal to source spontaneous emission ratio: ≥ 80 dB/nm, ≥ 90 dB/0.1 nm.
Signal to total source spontaneous emission ratio: ≥ 75 dB.
Side-mode suppression ratio (typical): ≥ 70 dB (1515 nm to 1620 nm, max. output power), ≥ 60 dB (full wavelength range, max. output power).
Relative intensity noise (RIN) (0.1 to 6 GHz): < -150 dB/Hz (typical, 1515 nm to 1620 nm, max. output power)
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