Keysight (Agilent) B1530A CALIBRATION and Keysight (Agilent) B1530A REPAIR

A calibration by Custom-Cal is performed by engineers with extensive OEM experience. We have the expertise and the necessary standards to perform the Keysight (Agilent) B1530A Calibration, onsite calibration may be available. We specialize in quick turnaround times and we can handle expedited deliveries upon request.

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   Keysight (Agilent) B1530A   Description / Specification:    
Keysight (Agilent) B1530A Waveform generator/fast measurement unit

The Agilent B1530A WGFMU is the first self-contained module to offer the combination of arbitrary linear waveform generation (ALWG) with synchronized fast current or voltage (IV) measurement, which enables accurate high-speed IV characterization. . The ALWG function allows you to generate not only DC, but also various types of AC waveforms (such as pulses, staircase sweeps, and staircase pulsed sweeps) with 10 ns programmable resolution. In addition to this versatile sourcing capability, the B1530A WGFMU also performs fast AC measurement in synchronization with the applied waveforms. The combination of these capabilities into a single module enables the characterization of complex high-speed phenomena without the need to switch between different resources to do the DC/AC voltage forcing and the current or voltage measurement.

Operation modes: Fast IV mode or PG mode.
Waveform timing resolution: 10 ns.
Minimum pulse width: 100 ns (PG mode), 300 ns (Fast IV mode).
Waveform level: -5 V to 5 V, 0 V to 10 V, 0 V to -10 V.
Current measurement ranges: 1 µA, 10 µA, 100 µA, 1 mA, 10 mA.
Current or voltage measurement sampling interval: Minimum 5 ns (200 Mega-Samples/sec).
Effective resolution: 0.2% of the range (without averaging) (The effective resolution can be improved by increasing the averaging).


Standard Calibration $425.00 *
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*This is a Web introductory price for one calibration of the Keysight (Agilent) B1530A. Price does not in most cases include measurement performance data. Pricing does include NIST traceable calibration and issue of a calibration certificate and calibration label. Pricing may vary slightly due to volume and location of laboratory supporting calibration. Volume pricing may apply. On-site fees may apply depending on logistics, location and volume of work to be completed during the visit.

Related Bench Equipment Terms and Definitions. For a complete list go to our  Terms and Definitions Page.

Crest Factor
Crest factor or peak-to-average ratio (PAR) is a measurement of a waveform, calculated from the peak amplitude of the waveform divided by the RMS value of the waveform

Linearity is the relative difference between the displayed power ratio, Dx/D0, and the actual (true) power ratio Px/P0 caused by changing the displayed power level from the reference level, D0, to an arbitrary displayed level, Dx.

Phase Noise
Phase noise is the frequency domain representation of rapid, short-term, random fluctuations in the phase of a waveform, caused by time domain instabilities. Phase noise (L(f)) is typically expressed in units of dBc/Hz, representing the noise power relative to the carrier contained in a 1 Hz bandwidth centered at a certain offsets from the carrier.

Sensitivity is the minimum magnitude of input signal required to produce a specified output signal having a specified signal-to-noise ratio, or other specified criteria.

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